Wafer Cassette Measurement System
Non-contact measuring system for CD of wafer carrier used in semiconductor process
Contact SalesFeature
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Process Performance
· Machine Dimension: 1330mm X 1230mm X 1700mm
· Machine Weight: Approx. 1000kg
· Electric Power: 3Ф 220V 60Hz 10kVA
· Clean Air: Over 6kg
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Productivity / Hardware
· Design of measuring head composed of laser distance sensor, CCD camera and LED ring light
· Minimize tact time by application of a telecentric lens that provides a wide focal length
· Automatic door open/close system for the wafer carrier
· Application of continuous rotary table to measure in various directions
· Provide jigs for equipment inspection to check machine errors
· Customize Hardware / UI Software
Specifications
Parameter | Categorization | Specification |
Carries Size | 300mm wafer carrier | |
Travel Length | Head | 450mm X 100mm X 400mm |
Carrier | 360° continuous | |
Movement Resolution | 0.1um | |
Max Velocity | Head | 250mm/s |
Carrier | 90°/2s | |
Machine Accuracy | Head | 3±L/300 (um, L:mm) |
Carrier | 15arc.sec | |
Measuring Repeatability | 50um |
■ Customizable Hardware/Software UI